Product Overview and 2025 Market Relevance Silicon carbide (SiC) device burn-in and automated test equipment (ATE) provide the high-temperature, high-voltage stress environments required to screen early-life failures and verify lifetime under harsh conditions. Compared with traditional silicon, SiC’s higher electric field strength and elevated junction temperatures demand specialized ovens, power stress fixtures, parametric measurement units, … Continue reading Silicon Carbide Device Burn-In and Automated Test Equipment for 175–200°C Reliability Qualification